바로가기 메뉴
본문 바로가기
푸터 바로가기
TOP

A fast image enhancement technique using a new scanning path for critical dimension measurement of glass panels

저자

Nam-Thai Doan, Jun-Hee Moon, Tai-Wook Kim, Heui-Jae Pahk

저널 정보

International Journal of Precision Engineering and Manufacturing, Vol. 13, No. 12, 2012, pp. 2109–2114

출간연도

2012