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Active Contour Method Based Sub-pixel Critical Dimension Measurement of Thin Film Transistor Liquid Crystal Display (TFT-LCD) Patterns

저자

Lee, Jeong Hoon , Kim, Tai-Wook , Ku, Dong Hun , Pahk, Heui Jae

저널 정보

International journal of precision engineering and manufacturing, v.21 no.5, 2020, pp.831 - 841

출간연도

2020