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Heui Jae Pahk, Professor Emeritus
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98. Three Dimensional Measurement System using Conoscopic Holography Microscope
주최
SNU Precision Co., 2002.3.1.-2005.2.28. Principal Investigator
기간
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97. Skull Measurement System for Tailored Wig and Helmet
다음
99. Wafer Bump Inspection System, Step System Co
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