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Heui Jae Pahk, Professor Emeritus
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77. ARTIFICIAL INTELLIGENCE BASED DATA ANALYSIS FOR MUTISPECTRAL BACKFOCAL PLANE
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Korea
Patent number
10-2773077
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76. THICKNESS MEASUREMENT METHODS USING THREE DIMENSIONAL INTENSITY SURFACE
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78. ANGLE RESOLVED SPECTROSCOPIC ELLIPSOMETER USING SPATIAL LIGHT MUDULATOR AND THICKNESS MEASURING METHOD FOR THIN FILM
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