Alumni

Metrology & Thin film Proceess Lab

PhD Students Graduated (44)

[2026.02 기준]

성명졸업년도학위대표 연구
Lee Se Jun2026PhDMueller Matrix Micro-Ellipsometry with Structured Light
Kim Young Joon2025PhDSnap-shop angle resolved channeled spectroscopic micro ellipsometry for thin film characterization
Ku Dong Hun2024PhDEnhancing battery exterior defect inspection accuracy through defect background separated generative adversarial network development
Kim Min Gyu2024PhDAngle resolving spectral ellipsometry using structured light for direct measurement of ellipsometric parameters
Lee Jung Hoon2023PhDSuper resolution optical microscopy using pattern light source
Lee Shin Yong2022PhDSingle-shot coaxial ellipsometry for simultaneous acquisition of reflectance using frequency modulation of spectral signals and incoherent optical path
Cho Young Chan2022PhDSimultaneous thin film and profile measurement interferometer using imaging spectrometer and multi-order retarder
Choi Garam2021PhDSingle-shot spectral angle resolved ellipsometry using multi-spectral back focal plane imaging and phase retardance
Lee Seung Woo2021PhDMicro-spot co-axial spectroscopic snap-shot ellipsometry using high frequency modulation and selective measurement for spectral signals
Kim Jin Yong2020PhDMeasurement of volumetric thin film thickness and optical constants using angle resolved and polarized high magnification imaging ellipsometry
Kim Do Hun2019PhDThe analytical method of the angular distribution of the molecular flux with intermolecular collisions emitted from a cylindrical nozzle
Kim Nam Yoon2019PhDNon-scanning interferometry for surface profile and thickness measurement of transparent thin film using color camera
Kim Sang Yun2018PhDImprovement of image resolution and accuracy at long distance measurement using the deep learning method
Kim Jae Ho2018PhDDevelopment of micro-spectroscopic ellipsometry for thickness and optical constant measurement of fine patterns on thin film
Kim Min Gab2018PhDImprovement of wavelength resolution in imaging spectroscopic reflectometer using rotating-type filter and tunable aperture
Kim Jae Ho2017PhDDevelopment of micro-spectroscopic ellipsometry for thickness and optical constant measurement of fine patterns on thin film
Kim Min Soo2017PhDStudy on simultaneous measurement of surface profile and film thickness using white light interferometry
Kwon Soon Yang2016PhDCorrection of scanner errors using a capacitive sensor and phase compensation in White Light Phase Shifting Interferometry
Lee Myung Sun2016PhDAngular Distribution of Molecular flow from Nozzles in Thermal Evaporation Process
Mun Jung Il2016PhDStudy on the prediction of thermal evaporated thin film profile in Roll-To-Roll process by Virtual Collision Direct Simulation Monte Carlo
Ahn Jae Hyung2015PhDA study on low voltage scanning electron microscopy for improvement of measurement accuracy
Kim Kwang Rak2015PhDMeasurement of Volumetric Film Thickness using Phase Extraction Method and Imaging Spectroscopic Reflectometry
Yoon Do Hyung2014PhDImprovement of Measurement Accuracy for Stroboscopic Interferometry using Scanning Synchronization System and Synchronizing Time Shifting Algorithm
Hyun Chang Hong2015PhDCorrection of Fringe Order Determination Error using Color CCD Camera in White-Light Phase-Shifting Interferometer
Kim Sung Ryong2014PhDCorrection of Phase Error Using 2 Cameras In White-Light Phase-Shifting Interferometer
Park Sung Hun2014PhDA Study on the SEM (Scanning Electron Microscopy) Imaging System for Critical Dimension Measurement of Semiconductor
Jo Tae Young2013PhDDevelopment of Spectral Imaging Reflectometer with Acousto-Optic Tunable Filter for Thin-film Thickness Profile Measurement
Doan Nam Thai2013PhDA fast super-resolution image reconstruction using a high-speed sub-stepping system for glass panel inspection
Kim Tae Wook2012PhDDevelopment of CIGS Thin Film Solar Cell Bulge Patterning Technique using Pico-Second Laser
Li Chu Zheng2011PhDAccurate calibration methods for small-depth objects in digital fringe projection
Kim Yoo Sik2009PhDGeneration of Two-Dimensional Image using White Light Interferometry
Lee Jung Ho2008PhDDevelopment of LCD Pattern Defect Inspection System using Image Processing Algorithm and Machine Learning
Yoon Sung Won2007PhDDevelopment of Two-Wavelength Simultaneous Phase-Shifting Interferometry using 4 CCD Cameras and Clustering Method for Order Stabilization
Kim Jung Hwan2007PhDDetermination of Fringe Order using 2-Dimensional Phase Unwrapping in White Light Phase Correction Interferometry
Kim Seok2006PhDInterferogram Analysis for AFM Cantilever Dynamic Deformation Measurement
Hwang Young Min2005PhDThin-Film Thickness Profile Measurement using Wavelet Transform in Wavelength Scanning Interferometry
Lee Il Hwan2005PhDDevelopment of Critical Dimension Measurement System for TFT-LCD Patterns using Subpixel Edge Detection
Ahn Woo Jung2005PhDNumerical Correction of Phase Error in White Light Phase Shifting Interferometry
Shin Hyun Jang2004PhDDevelopment of Precision 3-Phase Synchronous Planar Motor using Robust Control
Lee Dong Sung2004PhDDevelopment of In-Lined LCD Pattern Inspection system using Tomographic Imaging
Park Jong ho2003PhDDevelopment of the 6 DOFs ultra precision positioning system using the PZT actuators and elastic hinges
Moon Jun Hee2002PhDAnalysis and optimal design of a pneumatic vibration isolation system
Park Jong Ho2002PhDDevelopment of the 6 DOFs ultra precision positioning system using the PZT actuators and elastic hinges
Lee Suk Won2000PhDDevelopment of thermal error measurement and compensation system for spindle and feed axis in CNC machine tools

MSc Students Graduated (79)

[2026.02 기준]

성명졸업년도학위학위논문
Ahn Ji Yoon2026MScSingle-Sequence Spectroscopic Imaging Reflectometry
Lee Jong Hwan2026MScStructured Light Source Design for Accurate Micro-ellipsometry Measurement
Kim Jong Young2025MScStudy on the Measurement of DLC Coating on Carbon Steel Using Dual Rotating Compensator Ellipsometry
Bak Seung Kwan2024MScFoldable thin glass(FTG) surface defect detection system with dust separation  
Lee Eui Geon2022MScComplex lens alignment system using blur estimation and 2-shot measurement 
Kim Won Jin2021MScHeight Measurement in Imaging Reflectometry using Focus Function of Multi-spectral Images.
Park Ji Hun2019MScRegion Classification and Thin-film Thickness Measurement Using Color Camera Imaging Mueller Matrix Ellipsometry
Park Ji Tae2019MScRefractive Index Measurement of Bulk Materials Based on Polarization Analysis using Mono Camera
Kim Seung Jae2018MSc Acquisition of Color Image Using a Monochrome Camera in White-Light Interferometer
Kim Sung Wook2018MScImprovement of Labeling Performance using K-Means Clustering in TFT-LCD Defect Classification Process
Lee Yong Jun2018MScImprovement of Accuracy for Overlay Measurement using Blur Edge Modeling by Focal Length in Align Process
Lee Yoon Hyuk2018MScThin-flim Thickness Profile Measurement Using Color Camera Imaging Reflectometry
Lee Jong Hoon2016MScStudy on mechanical method to distinct Injection Volume of Liquid Crystal in Cell manufacturing process
No Ha Na2016MScDevelopment of Tomographic Imaging and Fitting Methods for Critical Dimension Measurement of TFT-LCD : Tomographic Imaging과 Fitting 
Yoon Dae Gun2016MScDevelopment of Sealant Detection Methods using Auto-Finding Algorithm in TFT-LCD Glass Bonding Process : 
Lee Sun Mi2016MScImprovement of Measurement Repeatability for White Light Phase Shifting Interferometry by Phase Compensation 
Kim Nam Yoon2014MScA Study on Measurement of Critical Dimension Using Multispectral Illumination Optical System
Zhang Ze Woo2013MScResearch of Lateral Dynamics Minimizing a Web Distortion in Roll to Roll System
Kim Min Gab2013MSc A study on simulation of thin film thickness distribution for vacuum evaporation thin film process
Kim Jin Yong2012MScA Study on generating color fringe-free images using color camera in White-light Phase Shifting Interferometer
Lee Ki Hun2011MScInterference Microscopy for High Aspect-Ratio Via Measurement
Choi Soon Min2011MScDevelopment of Defect Inspection System Using Grraphics Unit in TFT-LCD
Kwon Soon Yang2011MSc A Study on thin-film thickness measurementusing HCF in White-light Phase shifting Interfercmetry
Kim Chang Gon2010MScDevelopment of Precision Aligner for Heavy Load using 6-DOF motion Stage and Computer Vision
Lee Ki Bae2010MScDevelopmeent of laser scriber system forr edge deelction of film solar cells
Ahn Jae Hyung2010MScAuto Astigma. Correction method in the scamming electron microscopy
Chu Ji Min2009MScA Study on Height Difference Measurement by Confocal Microscopy using Acousto-Ptic Deflector and Galvanometer
Lee Sang Chul2009MScA Study on Thickness Shape Measurement of Transparent Thin-film with Acousto-optic Tunable Filter and CCD Camera
Kim Kwang Rak2009MScA study on Thickness Shape Measurement of Transparent Thin-film with Linear Variable Filter and CCD Camera
Kim Gang Gun2008MScDefect Detection and Automatic Defect Classification of TFT-LCD Panels in Automatic Optical Inspection System
Im Do Gyeong2008MScAutomatic Correction of Fringe Order Determination Error in White Light Phase Shift Interferometry
Jo Tae Young2008MSc A Study on Thin-film Thickness measurement using Spectral Analysis in White-lght Phase shifting Interferometry
Ha Sang Mo2007MScDevelopment of alignment-key measurement system in TFT-LCD CELL-processing using subpixel algorithm
Oh Kyung Kyun2007MScStudy on Thickness Measurement of Multilayer Thin fillm with Seectral Reflectomeetry
Park Sung Hoon2007MScThe 3 Dimentional Shape Restorration Using SFF(Shape From Focus) and Algorithm Deevelopmeent for Precision Improvemeent of Focus Measurement
Yang Sung Wook2006MScStudy on Measurement of Thickness and Chromaticity for Transparent Thin Film
Kang Seong Beom2006MSc

Fast defect detection and classification of patterned thin film transistor-liquid crystal displays

An Jun2006MScDevelopment of Particle Inspection Method Using Sub Pixel Algorithm in TFT-LCD Photo-Lighogrrapht Process
Yoo Jae Suk2006MScRobust Design of Dynamic Weighing System in a Moving Coneyor
Seong Ho Yong2005MScDevelopment of long range Z-axis Stage using the Piezo Actuator and Elastic Hinge
Ahn Sung Min2005MScImprovement in RReesponse Speed of Piezo Actuator using PID Servo-Positionnall Control and FIR Filter
Song Zhengyu2005MSc Development of micro drill inspection system using computer vision
Kim Hyun Jun2004MScDevelopment of the integrated measuring system of strain distribution and defect using ESPI0 & Shearography
Kim Yu Sik2004MSc Development of Atomic Force Microscope using flexure stage
Park Ji Yeol2003MSc Development of Wafer Defects Inspection Technique using Computer Vision
Lee Dong Jun2003MScA study on the development of the integrated errror measurement and calibration system for a chip mounter
Lee Jong Hwa2003MScDevelopment of 3 dimentiona BGA inspection system using conoscopic vision and computer vision
Cho Hoon Koo2003MScDevelopment of non-contact technique of stress measurement and defect inspection using laser specke interferometry
Kim Yoo Sik2003MScDevelopment of the Ultra Precision XYZ stage using the Piezo Actuator and Elastic Hinge for AFM
Kang Hyun Jae2002MScDevelopment of Inspection System for PigTail Using Computerr Vision with Optical Microscope
Seo Dae Gyu2002MScA study on the Distortion of Images Measured by AFM
Um Yong Hwan2002MScDevelopment of thermal error measurement and compensation system forr feed axis in CNS machine tool using the kinematic ball bar 
Lee Gi Su2002MSc Development of welding inspection system forrr yoke using computerr vision
Roh Young Hun2001MScA Study on the Lateral Calibration of Scanning Probe Microscope
Lee Chang Ha2001MScDevelopment of thermal error measurement and compensation system forr feed axis in CNS machine tool using the kinematic ball bar 
Han Sang Jin2001MScDevelopment of Three D.O.F. Alignment Stage for Vacuum Environment
Kim Ki Heung2000MScDevelopment of Kinematic Ball Bar System for Volumetrric Error Assessment of CNC Machine Tools
Sin Ho Seung2000MSc Developmen of Measureing System for Camera Lens Resolution. Based in the MTF Performance
Hwang Young Min2000MScDeveelopment of Inspection System for Gear Using Computer Vision with Optical Microscope
Kim Tae Wook2000MScUltra Precision Positioning System using. Ballscrew-Piezzo. Actuator and dual servo loop 
Lee Jung Ho2000MSc The Development of Ultra-precision 6-DOF motion stage using the Lever-Linkages
Li Zhu Cheng2000MScImprovement of Positioning Accuracy in the Wafer Stepper
Cho Sang Hyun1999MSc3D shape measurement using the SFF (Shape From Focus) algorithm
Kim Seok1999MSc Development of Inspection System for Gear Profile with Coordinate Measuring Machine
Kim Jung Hwan1999MSc Development of Measurrement System of Static and Dynamic Stiffness of Machine Tool
Yoon Sung Won1999MScDevelopment of Robot Deburring System using a 6 DOF Robot
Lee Dong Sung1998MScDevelopment of Ultra precision positioning system for Servo Motor-Piezo actualtor using dual servo loop
Shin Hyun Jang1998MSc Development of System for Measurement and Evaluation for Machine tool Spindle
Kim Young Sam1998MScDevelopment of Robot Deburring System using a Forcetouque Sensor and 6 DOF Robot
Park Jae Sung1997MSc Development of Managing System of Vision Probe for CMM
Ahn Woo Jung1997MScDevelopment of Non-Contact Coordinate Measuring Machine for Micro Pattern using Computer Vision and Optical Window
Lee Il Hwan1997MScSpot Inspection System for Camera Target Lens using the Computer Aided Vision System
Kim In Ki1996MScPrecision Measurement System for Ball Screw Pitch Error
Yeo In Jae1996MScDevelopment of 3Dimensional Inspection system for Bicycle frame using CCD Camera
Park Jong Ho1996MScDevelopment of the Ultraprecision Positioning Mechanism Using the Piezo Actuators and the Universal Circular Flexures 
Kim Young Ho*1994MScA Study on Development of CAD-directed Automated Inspection System for Product with Sculptured Surface Profile
Hwang Sang Wook*1994MScDevelopment of Error Measurement System for Linear. Motion Table
Kim Jong Hoo*1993MSc Development of Error Compensating System for Commercial CMMs
Ahn Kyung Ki*1993MSc Development. of an Active Vibration Isolation System using Neurral Networks

(*MSc students supervised from March 1992 to August 1993 at POSTECH)