졸업생
Metrology & Thin film Proceess Lab
PhD Students Graduated (44)
[2026.02 기준]
| 성명 | 졸업년도 | 학위 | 대표 연구 |
|---|---|---|---|
| Lee Se Jun | 2026 | PhD | Mueller Matrix Micro-Ellipsometry with Structured Light |
| Kim Young Joon | 2025 | PhD | Snap-shop angle resolved channeled spectroscopic micro ellipsometry for thin film characterization |
| Ku Dong Hun | 2024 | PhD | Enhancing battery exterior defect inspection accuracy through defect background separated generative adversarial network development |
| Kim Min Gyu | 2024 | PhD | Angle resolving spectral ellipsometry using structured light for direct measurement of ellipsometric parameters |
| Lee Jung Hoon | 2023 | PhD | Super resolution optical microscopy using pattern light source |
| Lee Shin Yong | 2022 | PhD | Single-shot coaxial ellipsometry for simultaneous acquisition of reflectance using frequency modulation of spectral signals and incoherent optical path |
| Cho Young Chan | 2022 | PhD | Simultaneous thin film and profile measurement interferometer using imaging spectrometer and multi-order retarder |
| Choi Garam | 2021 | PhD | Single-shot spectral angle resolved ellipsometry using multi-spectral back focal plane imaging and phase retardance |
| Lee Seung Woo | 2021 | PhD | Micro-spot co-axial spectroscopic snap-shot ellipsometry using high frequency modulation and selective measurement for spectral signals |
| Kim Jin Yong | 2020 | PhD | Measurement of volumetric thin film thickness and optical constants using angle resolved and polarized high magnification imaging ellipsometry |
| Kim Do Hun | 2019 | PhD | The analytical method of the angular distribution of the molecular flux with intermolecular collisions emitted from a cylindrical nozzle |
| Kim Nam Yoon | 2019 | PhD | Non-scanning interferometry for surface profile and thickness measurement of transparent thin film using color camera |
| Kim Sang Yun | 2018 | PhD | Improvement of image resolution and accuracy at long distance measurement using the deep learning method |
| Kim Jae Ho | 2018 | PhD | Development of micro-spectroscopic ellipsometry for thickness and optical constant measurement of fine patterns on thin film |
| Kim Min Gab | 2018 | PhD | Improvement of wavelength resolution in imaging spectroscopic reflectometer using rotating-type filter and tunable aperture |
| Kim Jae Ho | 2017 | PhD | Development of micro-spectroscopic ellipsometry for thickness and optical constant measurement of fine patterns on thin film |
| Kim Min Soo | 2017 | PhD | Study on simultaneous measurement of surface profile and film thickness using white light interferometry |
| Kwon Soon Yang | 2016 | PhD | Correction of scanner errors using a capacitive sensor and phase compensation in White Light Phase Shifting Interferometry |
| Lee Myung Sun | 2016 | PhD | Angular Distribution of Molecular flow from Nozzles in Thermal Evaporation Process |
| Mun Jung Il | 2016 | PhD | Study on the prediction of thermal evaporated thin film profile in Roll-To-Roll process by Virtual Collision Direct Simulation Monte Carlo |
| Ahn Jae Hyung | 2015 | PhD | A study on low voltage scanning electron microscopy for improvement of measurement accuracy |
| Kim Kwang Rak | 2015 | PhD | Measurement of Volumetric Film Thickness using Phase Extraction Method and Imaging Spectroscopic Reflectometry |
| Yoon Do Hyung | 2014 | PhD | Improvement of Measurement Accuracy for Stroboscopic Interferometry using Scanning Synchronization System and Synchronizing Time Shifting Algorithm |
| Hyun Chang Hong | 2015 | PhD | Correction of Fringe Order Determination Error using Color CCD Camera in White-Light Phase-Shifting Interferometer |
| Kim Sung Ryong | 2014 | PhD | Correction of Phase Error Using 2 Cameras In White-Light Phase-Shifting Interferometer |
| Park Sung Hun | 2014 | PhD | A Study on the SEM (Scanning Electron Microscopy) Imaging System for Critical Dimension Measurement of Semiconductor |
| Jo Tae Young | 2013 | PhD | Development of Spectral Imaging Reflectometer with Acousto-Optic Tunable Filter for Thin-film Thickness Profile Measurement |
| Doan Nam Thai | 2013 | PhD | A fast super-resolution image reconstruction using a high-speed sub-stepping system for glass panel inspection |
| Kim Tae Wook | 2012 | PhD | Development of CIGS Thin Film Solar Cell Bulge Patterning Technique using Pico-Second Laser |
| Li Chu Zheng | 2011 | PhD | Accurate calibration methods for small-depth objects in digital fringe projection |
| Kim Yoo Sik | 2009 | PhD | Generation of Two-Dimensional Image using White Light Interferometry |
| Lee Jung Ho | 2008 | PhD | Development of LCD Pattern Defect Inspection System using Image Processing Algorithm and Machine Learning |
| Yoon Sung Won | 2007 | PhD | Development of Two-Wavelength Simultaneous Phase-Shifting Interferometry using 4 CCD Cameras and Clustering Method for Order Stabilization |
| Kim Jung Hwan | 2007 | PhD | Determination of Fringe Order using 2-Dimensional Phase Unwrapping in White Light Phase Correction Interferometry |
| Kim Seok | 2006 | PhD | Interferogram Analysis for AFM Cantilever Dynamic Deformation Measurement |
| Hwang Young Min | 2005 | PhD | Thin-Film Thickness Profile Measurement using Wavelet Transform in Wavelength Scanning Interferometry |
| Lee Il Hwan | 2005 | PhD | Development of Critical Dimension Measurement System for TFT-LCD Patterns using Subpixel Edge Detection |
| Ahn Woo Jung | 2005 | PhD | Numerical Correction of Phase Error in White Light Phase Shifting Interferometry |
| Shin Hyun Jang | 2004 | PhD | Development of Precision 3-Phase Synchronous Planar Motor using Robust Control |
| Lee Dong Sung | 2004 | PhD | Development of In-Lined LCD Pattern Inspection system using Tomographic Imaging |
| Park Jong ho | 2003 | PhD | Development of the 6 DOFs ultra precision positioning system using the PZT actuators and elastic hinges |
| Moon Jun Hee | 2002 | PhD | Analysis and optimal design of a pneumatic vibration isolation system |
| Park Jong Ho | 2002 | PhD | Development of the 6 DOFs ultra precision positioning system using the PZT actuators and elastic hinges |
| Lee Suk Won | 2000 | PhD | Development of thermal error measurement and compensation system for spindle and feed axis in CNC machine tools |
MSc Students Graduated (79)
[2026.02 기준]
| 성명 | 졸업년도 | 학위 | 학위논문 |
|---|---|---|---|
| Ahn Ji Yoon | 2026 | MSc | Single-Sequence Spectroscopic Imaging Reflectometry |
| Lee Jong Hwan | 2026 | MSc | Structured Light Source Design for Accurate Micro-ellipsometry Measurement |
| Kim Jong Young | 2025 | MSc | Study on the Measurement of DLC Coating on Carbon Steel Using Dual Rotating Compensator Ellipsometry : 듀얼 로테이팅 컴펜세이터 엘립소메트리를 이용한 탄소강 위의 DLC 코팅 두께 측정 |
| Bak Seung Kwan | 2024 | MSc | Foldable thin glass(FTG) surface defect detection system with dust separation : 이물 구분 가능한 Foldable thin glass 표면 결함 검사 시스템 |
| Lee Eui Geon | 2022 | MSc | Complex lens alignment system using blur estimation and 2-shot measurement : 초점 모델 추정을 이용한 복합렌즈의 고속 위치 보정 시스템 개발 |
| Kim Won Jin | 2021 | MSc | Height Measurement in Imaging Reflectometry using Focus Function of Multi-spectral Images. : 다파장 이미지의 초점 함수를 이용한 이미징 반사계에서 높이 측정 |
| Park Ji Hun | 2019 | MSc | Region Classification and Thin-film Thickness Measurement Using Color Camera Imaging Mueller Matrix Ellipsometry : 컬러 카메라 이미징 뮬러 행렬 엡립소미터를 이용한 영역 분류와 박막 두께 측정에 관한 연구 |
| Park Ji Tae | 2019 | MSc | 편광해석과 흑백카메라를 활용한 벌크 소재의 굴절률 측정 : Refractive Index Measurement of Bulk Materials Based on Polarization Analysis using Mono Camera |
| Kim Seung Jae | 2018 | MSc | 흑백카메라 백색광 간섭계에서 컬러 이미지 획득에 관한 연구 : Acquisition of Color Image Using a Monochrome Camera in White-Light Interferometer |
| Kim Sung Wook | 2018 | MSc | Improvement of Labeling Performance using K-Means Clustering in TFT-LCD Defect Classification Process : TFT-LCD결함 분류 공정에서의 K-Means Clustering을 이용한 라벨링 자동화 성능 향상에 대한 연구 |
| Lee Yong Jun | 2018 | MSc | 초점거리에 따른 Blur Edge Modeling을 이용한 Align 공정에서의 Overlay 측정의 정확도 개선 : Improvement of Accuracy for Overlay Measurement using Blur Edge Modeling by Focal Length in Align Process |
| Lee Yoon Hyuk | 2018 | MSc | Thin-flim Thickness Profile Measurement Using Color Camera Imaging Reflectometry : 칼라카메라 이미징 반사계를 이용한 박막의 두께 형상 측정 |
| Lee Jong Hoon | 2016 | MSc | 물리적 방법을 이용한 Cell 공정에서의 액정량 과부족 판별 방법에 대한 연구 : Study on mechanical method to distinct Injection Volume of Liquid Crystal in Cell manufacturing process |
| No Ha Na | 2016 | MSc | Development of Tomographic Imaging and Fitting Methods for Critical Dimension Measurement of TFT-LCD : Tomographic Imaging과 Fitting 기법을 이용한 TFT-LCD의 Critical Dimension 측정에 대한 연구 |
| Yoon Dae Gun | 2016 | MSc | Development of Sealant Detection Methods using Auto-Finding Algorithm in TFT-LCD Glass Bonding Process : 자동 인식 알고리즘을 이용한 TFT-LCD 합착 공정에서의 Sealant 검출 방법 개발 |
| Lee Sun Mi | 2016 | MSc | Improvement of Measurement Repeatability for White Light Phase Shifting Interferometry by Phase Compensation : 위상보정을 이용한 백색광 위상 천이 간섭계에서의 반복능 향상에 관한 연 |
| Kim Nam Yoon | 2014 | MSc | 다파장 광원 광학계를 이용한 Critical Dimension 측정에 관한 연구 : A Study on Measurement of Critical Dimension Using Multispectral Illumination Optical System |
| Zhang Ze Woo | 2013 | MSc | R2R 장비에서 웹의 뒤틀림 및 변형을 최소화하기 위한 사행제어에 관한 연구 : Research of Lateral Dynamics Minimizing a Web Distortion in Roll to Roll System |
| Kim Min Gab | 2013 | MSc | 진공 증착 박막 공정에서의 박막 두께 분포 시뮬레이션에 관한 연구 : A study on simulation of thin film thickness distribution for vacuum evaporation thin film process |
| Kim Jin Yong | 2012 | MSc | 백색광 간섭계에서 칼라카메라를 이용하여 간섭상이 제거된 칼라영상 획득에 관한 연구 : A Study on generating color fringe-free images using color camera in White-light Phase Shifting Interferometer |
| Lee Ki Hun | 2011 | MSc | 큰 종횡비를 가지는 홀에서의 백색광 간섭계 적용에 관한 연구 : Interference Microscopy for High Aspect-Ratio Via Measurement |
| Choi Soon Min | 2011 | MSc | 그래픽 프로세싱 유닛을 이용한 TFT-LCD 공정에서의 결함 검사 시스템의 개발 : Development of Defect Inspection System Using Grraphics Unit in TFT-LCD |
| Kwon Soon Yang | 2011 | MSc | 백색광 주사 간섭계에서의 HCF를 이용한 박막두께 측정 : A Study on thin-film thickness measurementusing HCF in White-light Phase shifting Interfercmetry |
| Kim Chang Gon | 2010 | MSc | 6자유도 구동 스테이지와 컴퓨터 비젼을 이용한 고하중에서의 정밀 Aligner 개발 : Development of Precision Aligner for Heavy Load using 6-DOF motion Stage and Computer Vision |
| Lee Ki Bae | 2010 | MSc | 박막형 태양전지의 Edge Deletion을 위한 Laser Scriber 시스템 개발 : Developmeent of laser scriber system forr edge deelction of film solar cells |
| Ahn Jae Hyung | 2010 | MSc | 전자주사현미경에서 비점수차 보정에 관한 연구 : Auto Astigma. Correction method in the scamming electron microscopy |
| Chu Ji Min | 2009 | MSc | 음향광학 편향기와 갈바노미터를 이용한 공초점 현미경의 높이 단차 측정에 관한 연구 : A Study on Height Difference Measurement by Confocal Microscopy using Acousto-Ptic Deflector and Galvanometer |
| Lee Sang Chul | 2009 | MSc | 음향광학동조필터와 CCD카메라를 이용한 투명 박막의 두께 형상 측정에 관한 연구 : A Study on Thickness Shape Measurement of Transparent Thin-film with Acousto-optic Tunable Filter and CCD Camera |
| Kim Kwang Rak | 2009 | MSc | 선형가변필터와 CCD카메라를 이용한 투명박막의 두께형상 측정 : A study on Thickness Shape Measurement of Transparent Thin-film with Linear Variable Filter and CCD Camera |
| Kim Gang Gun | 2008 | MSc | 자동광학검사기(AOI)를 통한 TFT-LCD 패널의 결함검출 및 자동결함분류 : Defect Detection and Automatic Defect Classification of TFT-LCD Panels in Automatic Optical Inspection System |
| Im Do Gyeong | 2008 | MSc | 백색광 위상 천이 간섭계에서의 위상지연으로 인한 간섭 무늬 차수 결정 오류 자동 보정 : Automatic Correction of Fringe Order Determination Error in White Light Phase Shift Interferometry |
| Jo Tae Young | 2008 | MSc | 분광 해석을 통한 백색광 위상천이 간섭계에서의 투명박막 두께 측정 : A Study on Thin-film Thickness measurement using Spectral Analysis in White-lght Phase shifting Interferometry |
| Ha Sang Mo | 2007 | MSc | 서브픽셀 알고리즘을 적용한 TFT-LCD 셀 공정에서의 기준 정렬키 측정 시스템 개발 : Development of alignment-key measurement system in TFT-LCD CELL-processing using subpixel algorithm |
| Oh Kyung Kyun | 2007 | MSc | Spectral reflectometry를 이용한 다층 박막의 두께 측정에 관한 연구 : Study on Thickness Measurement of Multilayer Thin fillm with Seectral Reflectomeetry |
| Park Sung Hoon | 2007 | MSc | SFF(Shape From Focus)를 이용한 3차원 형상 복원 및 초점 측정의 정밀도 향상을 위한 알고리즘 개발 : The 3 Dimentional Shape Restorration Using SFF(Shape From Focus) and Algorithm Deevelopmeent for Precision Improvemeent of Focus Measurement |
| Yang Sung Wook | 2006 | MSc | 투명 박막의 두께와 색도 측정에 관한 연구 : Study on Measurement of Thickness and Chromaticity for Transparent Thin Film |
| Kang Seong Beom | 2006 | MSc | TFT-LCD 패널의패턴 영상에서의 고속 결함검출 및 결함분류 : Fast defect detection and classification of patterned thin film transistor-liquid crystal displays |
| An Jun | 2006 | MSc | 서브 픽셀 알고리즘을 이용한 TFT-LCD 노광 공정에서의 이물 검출 방법 개발 : Development of Particle Inspection Method Using Sub Pixel Algorithm in TFT-LCD Photo-Lighogrrapht Process |
| Yoo Jae Suk | 2006 | MSc | 고정밀 동하중 측정장치 구현을 위한 견실설계 : Robust Design of Dynamic Weighing System in a Moving Coneyor |
| Seong Ho Yong | 2005 | MSc | 압전구동기와 탄성힌지를 이용한 대변위 Z축 스테이지 개발 : Development of long range Z-axis Stage using the Piezo Actuator and Elastic Hinge |
| Ahn Sung Min | 2005 | MSc | 디지털 PID 서보 위치 제어와 FIR 필터를 이용한 압전소자 구동기의 응답 속도 향상 : Improvement in RReesponse Speed of Piezo Actuator using PID Servo-Positionnall Control and FIR Filter |
| Song Zhengyu | 2005 | MSc | 컴퓨터 비전을 이용한 마이크로 드릴 검사 시스템의 개발 : Development of micro drill inspection system using computer vision |
| Kim Hyun Jun | 2004 | MSc | ESPI & Shearography를 이용한 변형율 및 결함 검사 통합 측정 시스템 개발 : Development of the integrated measuring system of strain distribution and defect using ESPI0 & Shearography |
| Kim Yu Sik | 2004 | MSc | 플렉셔 스테이지를 이용한 원자현미경의 개발 : Development of Atomic Force Microscope using flexure stage |
| Park Ji Yeol | 2003 | MSc | 컴퓨터 비젼을 이용한 웨이퍼 표면 결함 검사 기술의 개발 : Development of Wafer Defects Inspection Technique using Computer Vision |
| Lee Dong Jun | 2003 | MSc | 칩마운터를 위한 통합 오차 측정 및 평가 시스템 개발에 관한 연구 : A study on the development of the integrated errror measurement and calibration system for a chip mounter |
| Lee Jong Hwa | 2003 | MSc | 코노스코픽 비젼과 컴퓨터 비젼 기술을 이용한 BGA칩 3차원 형상측정 기술 개발 : Development of 3 dimentiona BGA inspection system using conoscopic vision and computer vision |
| Cho Hoon Koo | 2003 | MSc | 레이저 스페클 간섭법을 이용한 비접촉 응력 측정 및 결함 검사 기술 개발 : Development of non-contact technique of stress measurement and defect inspection using laser specke interferometry |
| Kim Yoo Sik | 2003 | MSc | 탄성힌지와 압전소자를 이용한 AFM scanner용 초정밀 XYZ 스테이지 개발 : Development of the Ultra Precision XYZ stage using the Piezo Actuator and Elastic Hinge for AFM |
| Kang Hyun Jae | 2002 | MSc | 광학 응용 비젼 기술을 이용한 PigTail 형상 정밀 측정 시스템 개발 : Development of Inspection System for PigTail Using Computerr Vision with Optical Microscope |
| Seo Dae Gyu | 2002 | MSc | AFM의 이미지 왜곡에 관한 연구 : A study on the Distortion of Images Measured by AFM |
| Um Yong Hwan | 2002 | MSc | 기구 볼바를 이용한 공작기계 열변형 오차 측정 및 보정 시스템 개발 : Development of thermal error measurement and compensation system forr feed axis in CNS machine tool using the kinematic ball bar |
| Lee Gi Su | 2002 | MSc | 컴퓨터 비젼을 이용한 요크형상 측정장비의 개발 : Development of welding inspection system forrr yoke using computerr vision |
| Roh Young Hun | 2001 | MSc | 원자현미경(SPM)의 Lateral Calibration에 관한 연구 : A Study on the Lateral Calibration of Scanning Probe Microscope |
| Lee Chang Ha | 2001 | MSc | 기구 볼바를 이용한 공작기계 열변형 오차 측정 및 보정 시스템 개발 : Development of thermal error measurement and compensation system forr feed axis in CNS machine tool using the kinematic ball bar |
| Han Sang Jin | 2001 | MSc | 진공용 3자유도 얼라인먼트 스테이지의 정밀도 향상 기술 개발 : Development of Three D.O.F. Alignment Stage for Vacuum Environment |
| Kim Ki Heung | 2000 | MSc | CNC 공작기계의 입체오차 평가를 위한 기구 볼바 측정시스템 개발에 관한 연구 : Development of Kinematic Ball Bar System for Volumetrric Error Assessment of CNC Machine Tools |
| Sin Ho Seung | 2000 | MSc | MTF 측정에 의한 카메라 렌즈 해상력 검사 시스템 개발 : Developmen of Measureing System for Camera Lens Resolution. Based in the MTF Performance |
| Hwang Young Min | 2000 | MSc | 광학응용 비전기술을 이용한 기어형상 정밀 측정 시스템 개발 : Deveelopment of Inspection System for Gear Using Computer Vision with Optical Microscope |
| Kim Tae Wook | 2000 | MSc | 볼스크류-압전소자 구동기와 3자유도 이중서보제어기술을 이용한 초정밀 위치결정 시스템 개발 : Ultra Precision Positioning System using. Ballscrew-Piezzo. Actuator and dual servo loop |
| Lee Jung Ho | 2000 | MSc | 레버링키지를 이용한 초정밀 6자유도 운동 스테이지 개발 : The Development of Ultra-precision 6-DOF motion stage using the Lever-Linkages |
| Li Zhu Cheng | 2000 | MSc | 스테퍼 위치 정밀도 향상 기술 개발 : Improvement of Positioning Accuracy in the Wafer Stepper |
| Cho Sang Hyun | 1999 | MSc | SFF(Shape From Focus) 알고리듬을 이용한 3차원형상 측정: 3D shape measurement using the SFF (Shape From Focus) algorithm |
| Kim Seok | 1999 | MSc | 3차원 측정기를 이용한 기어 형상 측정 시스템 개발 : Development of Inspection System for Gear Profile with Coordinate Measuring Machine |
| Kim Jung Hwan | 1999 | MSc | 공작기계의 정강성 및 동강성 측정시스템 개발 : Development of Measurrement System of Static and Dynamic Stiffness of Machine Tool |
| Yoon Sung Won | 1999 | MSc | 6축 로봇을 이용한 디버링 시스템 개발 : Development of Robot Deburring System using a 6 DOF Robot |
| Lee Dong Sung | 1998 | MSc | 이중서보제어루프를 통한 서보모터-압전구동기의 초청밀위치결정 시스템 개발 : Development of Ultra precision positioning system for Servo Motor-Piezo actualtor using dual servo loop |
| Shin Hyun Jang | 1998 | MSc | 공장기계 주축 스핀들 종합오차 측정 및 평가 기술개발 : Development of System for Measurement and Evaluation for Machine tool Spindle |
| Kim Young Sam | 1998 | MSc | Forcetouque 센서와 6축 다관절 로봇을 이용한 디버링시스템 개발 : Development of Robot Deburring System using a Forcetouque Sensor and 6 DOF Robot |
| Park Jae Sung | 1997 | MSc | 3차원 측정기용 비젼프로브 운용시스템 개발 : Development of Managing System of Vision Probe for CMM |
| Ahn Woo Jung | 1997 | MSc | 광학창과 컴퓨터 비젼을 이용한 삼차원 미소 형상 측정 시스템 개발 : Development of Non-Contact Coordinate Measuring Machine for Micro Pattern using Computer Vision and Optical Window |
| Lee Il Hwan | 1997 | MSc | 비젼을 이용한 카메라 렌즈 이물질 검사 시스템 개발 : Spot Inspection System for Camera Target Lens using the Computer Aided Vision System |
| Kim In Ki | 1996 | MSc | 고정밀급 볼스크류 피치오차 측정장치 개발 : Precision Measurement System for Ball Screw Pitch Error |
| Yeo In Jae | 1996 | MSc | 자전거 프레임 형상 검사를 위한 비젼을 이용한 3차원 측정시스템의 개발. : Development of 3Dimensional Inspection system for Bicycle frame using CCD Camera |
| Park Jong Ho | 1996 | MSc | 압전 소자와 유니버설 원형 굽힘힌지를 이용한 초정밀 6자유도 운동 시스템개발 : Development of the Ultraprecision Positioning Mechanism Using the Piezo Actuators and the Universal Circular Flexures |
| Kim Young Ho* | 1994 | MSc | 자유곡면 형상 제품을 위한 CAD 지향의 자동 검사 A Study on Development of CAD-directed Automated Inspection System for Product with Sculptured Surface Profile |
| Hwang Sang Wook* | 1994 | MSc | 선형이송장치의 운동오차 측정시스템 개발 : Development of Error Measurement System for Linear. Motion Table |
| Kim Jong Hoo* | 1993 | MSc | 상용3차원측정기의 입체오차 보정 시스템 개발 : Development of Error Compensating System for Commercial CMMs |
| Ahn Kyung Ki* | 1993 | MSc | 신경회로망을 응용한 능동형 방진장치 개발 : Development. of an Active Vibration Isolation System using Neurral Networks |
(*MSc students supervised from March 1992 to August 1993 at POSTECH)